The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems through an exciting program that includes Keynote, Technical Paper Sessions, Panel, New Topic Sessions, Half-day and embedded Tutorials, Innovative Practices Tracks, PhD Student Contest.
 
In 2014 VTS will take place in Napa, California (USA) and will be sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

Check the website at http://www.tttc-vts.org for the preliminary program, registration, accommodation and travel information.

The technical program will include:

• Analog, Mixed-Signal & RF Test
• ATPG & Compression
• ATE Architecture & Software
• Built-In Self-Test (BIST)
• Defect & Current Based Tes
• Defect/Fault Tolerance
• Delay & Performance Test
• Design for Testability (DFT)
• Design Verification/Validation
• Diagnosis & Debug
• Embedded System & Board Test
• Embedded Test Methods
• Emerging Technologies Test
• FPGA Test
• Fault Modeling & Simulation
• Hardware Security
• Low-Power IC Test
• Microsystems, MEMS & Sensor Test
• Memory Test & Repair
• On-Line Test & Error Correction
• Power & Thermal Issues in Test
• System-on-Chip (SOC) Test
• Test Standards
• Test Economics
• Test of Biomedical Devices
• Test of High-Speed I/O
• Test Quality & Reliability
• Test Resource Partitioning
• Transients & Soft Errors
• 2.5D, 3D and SiP Test

• Beyond DFT: The Convergence of DFM, Variability, Yield and Test- Srikanth Venkataraman (Intel)
• Hardware Security and Test- Ozgur Sinanoglu (New York University Abu Dhabi); Miodrag Potkonjak (University of California, Los Angeles); Peilin Song (IBM TJ Watson)

SYMPOSIUM REGISTRATION

Registration now open!!  Avail Early Reg. rates before April 1, 2014
 
Registration is available at:  http://www.tttc-vts.org/public_html/new/2014/practical.php

General Information

General Chair

Claude THIBEAULT

École de technologie supérieure, Montreal, QC, Canada

Program Information

Program Chair

Yiorgos MAKRIS

The University of Texas at Dallas

Email: yiorgos.makris@utdallas.edu

The IEEE VLSI Test Symposium (VTS 2014 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).